NenoVision - we develop and produce AFM-in-SEM LiteScope
NenoVision is connecting a long tradition of development of scientific instruments with leading innovations within the industry. We are pioneers of in-situ correlative microscopy, developing and producing unique AFM-in-SEM LiteScope. Our mission is to create unique tools on the top technological level which drive new discoveries with significant impact.. Our vision is to build a successful technological company that provides researchers with innovative and unparalleled advanced scientific instrumentation. We develop, manufacture, and sell a revolutionary type of atomic force microscope (AFM) LiteScope™ designed for fast and easy integration into scanning electron microscopes (SEMs). NenoVision is a technology company based in Brno, Czech Republic. Our goal is to move microscopy to the next level. NenoVision continues with the established tradition and expertise within the field and brings innovative Correlative Probe and Electron Microscopy technology to the market.
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Probes used in LiteScope AFM-in-SEM
Self-sensing probes for LiteScope | Akiyama | NenoProbe Magnetic | NenoProbe Conductive | Piezo-resistive probes | See also | Key benefits in the characterisation of Powders, Particles, and 2D materials by AFM-in-SEM | The AFM-in-SEM technique: True correlative sample analysis with the LiteScope | In-situ Microscopy Alliance webinar: The introduction of IMA | Váš prohlížeč není podporován
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LiteScope AFM-in-SEM
LiteScope AFM-in-SEM | Benefits of AFM-in-SEM solution | Novel method of correlative imaging | Complex in-situ characterisation | LiteScope benefits | LiteScope setup | Installation package: | LiteScope - scan head | Nenobox - control unit | NenoView - control software | Technical specification | See application examples | Product news | Learn more about the LiteScope 2.5 in the fresh article: AFM meets SEM | A webinar on the characterisation of Powders, Particles, and 2D materials by AFM-in-SEM | The AFM-in-SEM technique: True correlative sample analysis with the LiteScope | Introduction webinar of the In-situ Microscopy Alliance | Váš prohlížeč není podporován
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Measurement modes of LiteScope AFM-in-SEM
LiteScope measurement modes | Mechanical modes | Topography | Energy Dissipation | Phase Imaging | Nanoindentation | Electro-mechanical modes | Piezoresponse Force Microscopy (PFM) | Electrical modes | Conductive AFM (C-AFM) | Kelvin Probe Force Microscopy (KPFM) | Electrostatic Force Microscopy (EFM) | Scanning Tunneling Microscopy (STM) | Magnetic modes | Magnetic Force Microscopy (MFM) | Spectroscopy modes | Force-distance curves | I-V curves | See also | Váš prohlížeč není podporován
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AFM-in-SEM study of Precipitates in Mg-Ca-Zn alloy
Precipitates in Mg-Ca-Zn alloy | See also | Váš prohlížeč není podporován
Where is NenoVision located?
The company NenoVision is located in Czechia. It's worth noting that the company may has more corporate locations
How many employees does NenoVision approximately have?
As of the latest available information NenoVision has around 11-50 employees worldwide.
When was NenoVision founded?
NenoVision was founded in 2015
In which industries does NenoVision mainly work?
The company NenoVision has it's main focus in the industries of Science and Engineering
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